Formalizing the Choice of Debugging Tests in the Design of Digital Microelectronic Systems Based on Checking the Performance of the Required Functions
Alexander D. Ivannikov, Alexander L. Stempkovsky · Russian Microelectronics · 2021
Abstract In order to debug projects of digital microelectronic systems, it is necessary to form a certain set of test influences on the simulated system in order to check the correctness of its functioning. A large number of digital systems are characterized by a sequence of functions from a finite alphabet. In this paper, a partial semigroup is defined on the set of admissible sequences of functions. The admissible sequences are formalized by introducing a graph of functions that specifies the possible functions for execution for various states of the digital system. The graph of functions together with the sets of input interactions for each function define the specification of the external behavior of the digital system. It is established that if the admissibility of the sequential execution of two functions depends on the previously performed functions and the state of the digital system, then some functions should be divided into subfunctions. It is shown that the set of debugging tests should include both checking the execution of sequences of functions and the correctness of the execution of each function with different sets of parameters.