Emergence of Biased Errors in Imperfect Optical Circuits
Fulvio Flamini · Physical Review Applied · 2021
We study the impact of experimental imperfections in integrated optical circuits. We discuss the emergence of a moderate biased error in path encoding, and investigate its correlation with properties of the optical paths. Our analysis connects and deepens previous studies in this direction, revealing potential issues in high-precision tests and optical implementations of machine learning.