Metrics for TRUST in Integrated Circuits
D. P. Wilt, R.C. Meitzler, J. DeVale · Defense Technical Information Center (DTIC) · 2008
In this paper we report on metrics approaches adapted for the DARPA TRUST in ICs program. A metrics approach initially focused on detection of malicious alterations in integrated circuit die has been adapted for use on FPGA bitstreams and the ASIC design process. We also discuss metrics for techniques focused on prevention of malicious alterations.