Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
Adam Osseiran · Kluwer Academic Publishers eBooks · 1999
List of Figures. List of Contributors. Preface. 1. Introduction to the IEEE 1149.4. 2. The Boundary-Scan Standard. 3. IEEE 1149.4 Architecture and Instruction Set. 4. System Test Methodologies Using IEEE 1149.4. 5. Peripheral Cell Design for IEEE 1149.4. 6. Structural Testing. Summary. Index.