Secure Scan Design through Pseudo Fault Injection
Seokjun Jang, Hyungil Woo, Sung‐Hoon Kim, Sungho Kang · 2021
In order to improve testability of the chips, scan-based test is widely adopted as the DFT technique. However, the inserted scan chains can also be exploited as side-channel for an attack by a malicious user, it becomes a serious threat. In this paper, a low-cost secure scan design using a pseudo fault injection method is proposed. The proposed design disables normal output of the scan data through fault injection for unauthorized users with small area overhead, and the proposed method makes it difficult to check whether obfuscation is made even for the incorrect test key input.