NOR Flash test system based on FPGA
Qin Qin, Bing Lü, Xin Wang · 2021
Flash memory has the characteristics of high speed reading and writing, large storage capacity, power down to save data and long data durability, etc., and has become the favorite of embedded devices such as smart home. This paper discusses the FLASH storage structure and NOR FLASH operation principle, describes the common failures of FLASH memory and analysis, introduces the BY25Q40AW function of the chip to be tested, and carries on the FPGA hardware design, test system function design, system simulation, and finally verifies the finished product. The FT232R chip of FIDI company is packaged in combination with the development board to complete the communication between the upper computer and the FPGA, and the lower computer is responsible for driving NOR Flash to be tested to complete the operation test. In order to achieve the expected function of the test system, the version iteration of the system can be carried out according to the test requirements, so as to have a better compatibility in different storage capacities.