A study of transistor degradation in cyber-physical system control devices
Spencer K. Millican, SueAnne Griffith · 2021
This work presents a plan for investigating transistor aging and degradation in cyber physical systems under attack. The authors discuss the importance of such concerns, particularly with regard to negative bias temperature instability, and an approach to demonstrate the adverse effects of a cyber-attack resulting in premature aging of transistors within a system's digital controllers.