Learning‐based mutant reduction using fine‐grained mutation operators
Yunho Kim, Shin Hong · Software Testing Verification and Reliability · 2021
Summary For mutation testing, the huge cost of running test suites on a large number of mutants has been a serious obstacle. To resolve this problem, we propose a learning‐based mutant reduction techniqueMuTrain.MuTrainuses cost‐considerate linear regression (i.e., CLARS) to learn amutation model, which predicts the mutation score of a test suite based on the mutation testing results of a previous version of a target program. Then,MuTrainapplies the mutation model for subsequent versions to predict mutation scores with significantly fewer mutants. For effective mutant reduction and accurate mutation score prediction,MuTrainuses fine‐grained mutation operators refined from the existing coarse‐grained mutation operators. The experiment results show thatMuTrainreduces the number of mutants effectively (i.e., selecting only 1.6% of mutants). Moreover,MuTrainpredicts mutation score far more accurately than the existing mutant reduction techniques and random mutant selection. We also found thatMuTrainachieves much greater mutant reduction when it uses the fine‐grained mutation operators than the traditional coarse‐grained mutation operators (i.e., 1.6% vs. 14.6%).