Gate All around with Back Gate NAND Flash Structure for Excellent Reliability Characteristics in Program Operation
Jae-Min Sim, Bong-Seok Kim, Inho Nam, Yun‐Heub Song · Electronics · 2021
A gate all around with back-gate (GAAB) structure was proposed for 3D NAND Flash memory technology. We demonstrated the excellent characteristics of the GAAB NAND structure, especially in the self-boosting operation. Channel potential of GAAB shows a gradual slope compared with a conventional GAA NAND structure, which leads to excellent reliability characteristics in program disturbance, pass disturbance and oxide break down issue. As a result, the GAAB structure is expected to be appropriate for a high stacking structure of future memory structure.