Fast Bayesian Tomography of a Two-Qubit Gate Set in Silicon
T. J. Evans, W. Huang, Jun Yoneda, Robin Harper, Tuomo Tanttu, K. W. Chan, Fay E. Hudson, Kohei M. Itoh, André Ricardo de Carvalho Saraiva, Chih Hwan Yang, Andrew S. Dzurak, Stephen D. Bartlett · Physical Review Applied · 2022
Complete characterization of the errors that occur in using sets of logic gates is critical to developing the technology of fault-tolerant quantum computing, but current tomography methods are either slow or include unchecked assumptions. This study presents a self-consistent method for process tomography that is both fast and flexible. The technique complements the broad suite of existing characterization tools, and may potentially allow for pulse optimization to further increase gate fidelities.