Multilayer Holographic Perceptrons for All-optical Aberration Detection
Elena Goi, Steffen Schoenhardt, Miṅ Gu · Conference on Lasers and Electro-Optics · 2021
We present aberration detectors based on multi-layered perceptrons printed by two-photon nanolithography. Through all-optical inference, the perceptrons can collect phase information from a point spread function performing direct aberration detection in a single step.