Method of Contrast Enhancement and Background Correction in Electron Diffraction Patterns of Polycrystalline Materials
V. I. Bondarenko, Elena I. Suvorova · Crystallography Reports · 2021
Abstract Noise minimization and suppression is one of the most important problems in image processing. Background correction and detection of weak reflections were performed using the well-known algorithms implemented in the ImageJ and Digital Micrograpph (GATAN) programs and developed in this paper for experimental electron diffraction patterns obtained from a nanocrystalline 10-nm-thick hafnium oxide layer. An algorithm for processing electron diffraction patterns is proposed, which is based on a multiscale Retinex filter and Hough transform. It is also devised to present electron diffraction patterns in polar coordinates, which is often more visual and convenient for indexing reflections.