Fundamental Reliability Theory
Liudong Xing, Gregory Levitin, Chaonan Wang · 2019
This chapter covers basic probability concepts, reliability measures, fault tree (FT) modeling, binary decision diagrams (BDDs), and Markov processes. Based on the types of logic gates and events used for constructing the FT model, FT can be classified as static, dynamic, phased-mission, and multi-state FTs. To construct a reduced ordered BDD from an FT, each input variable encoding the binary state of a system component is assigned a different index or order first. The chapter presents basics of BDDs and how to construct and evaluate a BDD model for system reliability analysis. It describes several quantitative reliability measures for a nonrepairable unit, including the failure function, reliability function, failure rate function, mean time to failure, and mean residual life. The state space-based methods belong to the analytical methods for system reliability analysis. Various reliability analysis software tools have been developed.