Physical Unclonable Functions Using Ferroelectric Tunnel Junctions
Sihyun Kim, Kitae Lee, Min-Hye Oh, Jong‐Ho Lee, Byung‐Gook Park, Daewoong Kwon · IEEE Electron Device Letters · 2021
We propose physical unclonable function (PUF) operations using ferroelectric tunnel junctions (FTJs) and verify the effects of their dimension scaling on the PUF. First, device-to-device variation and within-device reproducibility were measured from the FTJs with various dimensions, which were to be embedded to 4×4 FTJ cross-point array. Then, to obtain inter- and intra-chip fractional hamming distances (HDs), intra-chip reproducibility and inter-chip uniqueness were extracted from the FTJ array simulations. As a result, it is revealed that the more stable PUF operations are achievable in the cross-point array with scaled FTJs since inter-device variation is deteriorated much more seriously by the variation of domain number in the ferroelectric layer than intra-device variation.