Deep semi‐supervised classification based in deep clustering and cross‐entropy
Bruno Vicente Alves de Lima, Adrião Duarte Dória Neto, Lúcia Emília Soares Silva, Vinícius Ponte Machado · International Journal of Intelligent Systems · 2021
Self-labeled techniques, a semi-supervised classification paradigm (SSC), are highly effective in alleviating the scarcity of labeled data used in classification tasks through an iterative process of self-training. This problem was addressed by several approaches with different assumptions about the features of the input data, examples of these approaches being self-training, co-training, STRED, among others. This paper presents a framework for data self-labeling based on deep autoencoder combined with a self-labeled technique that takes into consideration cross-entropy. The model uses the Encoder to reduce the dimensionality of the input that is submitted to a labeling layer. The weights of this layer are adjusted through the learning from a clustering performed in the Z space, which is the reduced dimensionality space. Results showed that the proposed method obtained competitive performance in relation to classic methods that are found in the literature.