An optimal probe testing algorithm for the connectivity verification of MCM substrates
Yao, Chou, Cheng Cheng, Hu · IEEE/ACM International Conference on Computer-Aided Design · 1992
The k-probe testing methodology is an effective approach to detect open and short faults in MCM substrates. An algorithm which generates the minimum number of tests for complete open fault coverage is proposed. For k equals two, the algorithm is able to reduce the test size by up to 50% compared with that generated by an ordinary approach. A multidimensional traveling salesman problem formulation is developed to optimize probe routes. The approach has been tested on substrate testers and has achieved excellent results.>