Parallel X-fault simulation with critical path tracing technique
Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman · 2010
In this paper, a new very fast fault simulation method to handle the X-fault model is proposed. The method is based on a two-phase procedure. In the first phase, a parallel exact critical path fault tracing is used to determine all the detected stuck-at faults in the circuit, and in the second phase a postprocess is launched which will determine the detectability of X-faults.