Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey
Abderrahim Doumar, Hideo Ito · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2003
Topics related to the faults in SRAM-based field programmable gate arrays (FPGAs) have been intensively studied in recent research studies. These topics include FPGA fault detection, FPGA fault diagnosis, FPGA defect tolerance, and FPGA fault tolerance. This paper provides a guided tour to the approaches related to these topics. These include techniques, which are applied to the FPGA and others which have been recently introduced and can be applied to today's FPGAs.