Portable parallel test generation for sequential circuits
Ramkumar, Banerjee · IEEE/ACM International Conference on Computer-Aided Design · 1992
A parallel test generation algorithm, ProperTEST, for sequential circuits that is portable across a range of MIMD parallel architectures is discussed. It uses prioritized execution to ensure consistent speedups as the number of processors is increased. This consistency is achieved without loss of fault coverage with increase in the number of processors. This also permits the use of parallel processing to improve the fault coverage when the execution time is bounded. Results on ISCAS 89 benchmark programs are provided on a shared memory machine, a message passing machine, and a network of workstations. ProperTEST was run unchanged on these different architectures.>