An Efficient BIST Scheme for Non-Restoring Array Dividers
Haridimos T. Vergos · 2007
A new effective built-in self-test (BIST) scheme for non- restoring array dividers (NADs) is proposed, that offers more than 99% cell fault coverage in all NADs of practical use. Moreover, it can be implemented in small hardware and can apply all its test vectors within 128 clock cycles. A version of the proposed scheme for power critical applications is also exploited.