Latent Sector Error Modeling and Detection for {NAND} Flash-based SSDs
Guanying Wu, Chentao Wu, Xubin He · 2011
Latent Sector Error (LSE) is a well-known problem in HDD-based storage systems. LSEs, which occur silently, may result in data loss during RAID recovery from disk failure. LSEs in HDDs are caused by various reasons such as write errors or media imperfections [1], which result in bit/symbol errors that cannot be corrected with ECC. Disk scrubbing is used to detect LSEs by scrubbing the disk in the background. As pointed out in [2], the scrubbing strategy optimization requires a good model of LSE development, i.e., when and where LSE would likely happen. Inspired by previous work [1] [2], we are investigating the problem of modeling and detecting LSEs of NAND flash-based SSDs. Due to increased density, NAND flash memory is becoming more and more prone to bit errors [3], which