Exploit Analog IFA to Improve Specification Based Tests
B. Atzema, T. Zwemstra · 1996
In the recent past Inductive Fault Analysis (IFA) has been exploited for several aspects of analog testing. These include, test development, DfT schemes qualification, and fault grading. However, little attention is paid towards exploiting IFA in the design domain. In this paper we undertake a case study demonstrating how IFA can be exploited for improving specification based testing by design measures. The case study shows that the fault escape rate is lowered while specification based tests guarantee the parametric behavior.