Measurement for Low-Value Resistors
Dongxue Dai, Yan Rong Yang, Yan Chen, Wei Wang · 2020 7th International Forum on Electrical Engineering and Automation (IFEEA) · 2020
A method to measure low-value resistors based on the sampling technology is presented in this paper. This method is suitable for measurement from 1 mΩ to 100 mΩ, at frequency of 100 Hz, 120 H and 1 kHz. A 1-Ω standard resistor is taken as reference at its resistance. An inductive shunt is used to produce two precise equal currents in parallel connection so that the measured resistor and 1-Ω standard resistor can be measured against the earth. The voltage at the measured resistor should be amplified by the voltage amplifier circuit before sampling. The calibration procedure of the voltage amplifier circuit, the measurement results and their uncertainties are reported.