11th IEEE International On-Line Testing Symposium
2005
The following topics are dealt with: transient fault modeling and analysis; transient faults' hardening techniques; SEU effects in FPGA; soft errors; single-event effects; self-calibrating design; online testing for secure and asynchronous chips; self-checking strategies; process variations; leakage detection; power supply noise detection; integrated circuit testing; SoC testing; fault tolerance; multiple bit upset evaluation and correction; integrated circuit yield; and integrated circuit reliability.