Optimization of Energy and Area of a Randshift: Fault-Tolerant Technique using FPGA design flow
SK. Afifa Farman, Chaitanya Duggineni, K N V Khasim, Hima Bindu Valiveti · 2021
Stuck-at faults occur in secure non-volatile memories due to endurance issues. In non-volatile memories data is available to access for many years even after the power shut down, which enables unauthorized access to an attacker. Here, we use Advanced Encryption Standard (AES) algorithm which is powerful encryption algorithm in recent years to provide security for confidential data in cloud computing systems. We are also using random characteristics of the AES algorithm along with rotational shift operation that helps in fixing the faults present in main memories. The implementation of Randshift technique in FPGA design flow by using simulation analysis shows less energy consumption and area-efficient parameters compared to recently proposed fault-tolerant techniques.