Application of wavelet transform in I-V characteristic test of photoelectric sensor
Zhong Hai Lin, Fei Gao, Hong Yu Chen, Jia Yi Lei, Xiao Lin Li, Ai Xiang He · 2020 7th International Forum on Electrical Engineering and Automation (IFEEA) · 2020
The I-V characteristic test of photoelectric sensor will inevitably be interfered by the noise signal, especially when the output signal is weak. In order to improve the accuracy of I-V test, wavelet transform is selected to process the output signal of photoelectric sensor based on the analysis of noise characteristics in I-V characteristic test. The appropriate wavelet basis function and decomposition layers are determined by simulation experiments. The results show that wavelet transform can effectively eliminate the noise in the signal, obviously improve the accuracy of the characteristics I-V test.