System-Level Verification of Linear and Non-Linear Behaviors of RF Amplifiers using Metamorphic Relations
Muhammad Hassan, Daniel J. Grosse, Rolf Drechsler · 2021
System-on-Chips (SoC) have imposed new yet stringent design specifications on the Radio Frequency (RF) subsystems. The Timed Data Flow (TDF) model of computation available in SystemC-AMS offers here a good trade-off between accuracy and simulation-speed at the system-level. However, one of the main challenges in system-level verification is the availability of reference models traditionally used to verify the correctness of the Design Under Verification (DUV). Recently, Metamorphic testing (MT) introduced a new verification perspective in the software domain to alleviate this problem. MT uncovers bugs just by using and relating test-cases.