JAN transistor and diode characterization test program, JANTX diode 1N5623
Hironori Takeda · NASA STI Repository (National Aeronautics and Space Administration) · 1977
A statistical summary of the electrical characterization of diodes and transistors is presented. Each parameter is presented with test conditions, mean, standard deviation, lowest reading, 10% point (where 10% of all readings are equal to or less than the indicated reading), 90% point (where 90% of all readings are equal to or less than indicated reading) and the highest reading.