Characterization of EM faults on ATmega328p
Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid M.R. Verbauwhede, Saki Osuka, Masahiro Kinugawa, Daisuke Fujimoto, Yu‐ichi Hayashi · 2019
We investigate the effects of EM pulses on an ATmega328p 8-bit microcontroller. We establish which areas of the chip are sensitive to EM pulse injection and describe the fault model for these sensitive areas. Furthermore, we compare our results to those of a previous study, which examined the effects of laser fault injection on the same device.