ASCHyRO: Automatic Fault Localization of SystemC HLS Designs Using a Hybrid Accurate Rank Ordering Technique
Mehran Goli, Alireza Mahzoon, Rolf Drechsler · 2020
In order to meet time-to-market constraints and to raise the design productivity, High-level Synthesis (HLS) is being increasingly adopted by the semiconductor industry. HLS designs, which can be automatically translated into Register Transfer Level (RTL), are typically written in SystemC at the Electronic System Level (ESL). However, this modern design flow still has weaknesses, in particular, due to the significant manual effort involved for verification and the subsequent debugging process which are both time-consuming and error-prone. In this paper, we propose ASCHyRO, a fully automated semiformal fault localization approach for SystemC HLS designs. ASCHyRO takes advantage of a hybrid rank ordering technique to derive a reduced ordered set of potential fault locations. The reduced order set is obtained by calculating a Confidence Score (CS) for each fault candidate based on a combination of static and dynamic fault probability analysis. Experimental results including an extensive set of standard SystemC HLS designs show the effectiveness of our approach in localizing even multiple faults with high confidence in a short execution time.