Modeling Method of Local Mismatch Model for MOS Transistors
Jinglun Gu · 2020
In this paper, a MOS SPICE local mismatch model is presented, in which the temperature effect coefficient is added in the existing SPICE local mismatch model equation. The effect of temperature variation on SPICE local mismatch model of MOS devices is fully considered. This paper can accurately reflect the change of local mismatch with the change of temperature, so that the SPICE local mismatch model has a wider application range and a higher degree of coincidence with the measured data.