ANALYSIS OF CHARACTERISTIC FOR CED CIRCUITS BASED ON REDUNDANT ENCODING METHODS
Dmitry Vladimirovich Telpukhov, Tatiana D. ZHukova, A. N. Schelokov · Известия Южного федерального университета. Технические науки · 2020
Typically, soft errors that occur in electronic equipment under influence of various destabilizingfactors, were under the scrutiny of memory element developers. But recent research in thisarea shows that with development of microelectronics, the number of soft errors in combinationcircuits is increasing and soon their frequency of occurrence will be comparable to that in unprotectedmemory elements. Presently, to address this problem, special attention has been paid tomethods based on control devices. These methods, by introducing additional structural redundancy,enable scheme to automatically detect and/or correct errors that occur in it. However, as aresult of application of various methods of synthesis concurrent error detection (CED) circuitsdepending on initial parameters and internal structure of protected scheme devices possessingvarious efficiency and reliability characteristics are realized. However, as a result of applicationof various methods of synthesis CED circuits depending on initial parameters and internal structureprotected circuit, the devices possessing different efficiency and reliability characteristics arerealized. That is why there is a necessity to define and develop evaluation functions for analysis inorder to find the best method of synthesis CED circuit for certain device without any preliminarymodeling. This work is devoted to development specification of structural redundancy and reliabilitycharacteristics evaluation functions on the example of CED circuits on basis of spectral and lowdensityparity-check code. The comparative and correlation analysis of analytical data with experimentalvalues was carried out to evaluate efficiency of the functions obtained as a result of study.