Robust True Random Number Generator using Stochastic Short-Term Recovery of Charge Trapping FinFET for Advanced Hardware Security
Jianguo Yang, Qingting Ding, Tiancheng Gong, Qing Zheng Luo, Xiaoyong Xue, Zhaomeng Gao, Haoran Yu, Jie Yu, Xiaoxin Xu, Peng Yuan, Xiaoyan Li, Lu Tai, Steve Shao-Shiun Chung, Hangbing Lv, Ming Liu · 2020
In this work, we demonstrated a novel true random number generator (TRNG) utilizing stochastic short-term recovery of Charge- Trapping (CT) FinFET devices. The true random bits were generated by measuring the recovery time of CT-FinFET with a digital counter by a time-to-digital count converter (TDCC) unit. The resulting CT - TRNG circuit shows great immunity against a power noise of up to 600m V in amplitude and up to 1.5G Hz in frequency across a wide range of temperatures (-20 to 85°C). It passed all NIST 800-22 and NIST 800-90B randomness tests. We have shown this novel CT - TRNG to be the most promising high-reliability hardware security solution to date.