Probabilistic model of fault detection in quantum circuits
Anindita Banerjee, Anirban Pathak · 2012
It is shown that the fault testing for quantum circuits does not follow conventional classical techniques. If probabilistic gate like Hadamard gate is included in a circuit then the classical notion of test vector is shown to fail. We have reported several new and distinguishing features of quantum fault and also presented a general methodology for detection of functional faults in a quantum circuit. The technique can generate test vectors for detection of di erent kinds of fault. Speci c examples are given and time complexity of the proposed quantum fault detection algorithm is reported. 1