Effort-aware just-in-time defect identification in practice: a case study at Alibaba
Meng Ling Yan, Xin Xia, Yuanrui Fan, David Lo, Ahmed E. Hassan, Xindong Zhang · 2020
Effort-aware Just-in-Time (JIT) defect identification aims at identifying defect-introducing changes just-in-time with limited code inspection effort. Such identification has two benefits compared with traditional module-level defect identification, i.e., identifying defects in a more cost-effective and efficient manner. Recently, researchers have proposed various effort-aware JIT defect identification approaches, including supervised (e.g., CBS+, OneWay) and unsupervised approaches (e.g., LT and Code Churn). The comparison of the effectiveness between such supervised and unsupervised approaches has attracted a large amount of research interest. However, the effectiveness of the recently proposed approaches and the comparison among them have never been investigated in an industrial setting.