Work-in-Process: Smart Migration for Reliability Enhancement of 3D TLC NAND Flash Storage Systems
Yazhi Du, Jihua Gu, Zhongzhe Xiao, Min Huang · 2020
3D stacking technology further improves the storage density while it also induces a fast decline of reliable performance. Actually, the reliability has become the great obstacle for the overall performance of 3D Triple Level Cell (TLC) NAND flash-based storage systems since extra operations are required when the reliability of NAND flash declines with the increasing number of program/erase (P/E) cycles. We propose a smart migration strategy to recognize and classify weak-reliability physical pages, and meanwhile accurately rewrite weak-reliability physical pages during an idle period. Ultimately, it can reduce 8.54% and 12.46% error pages on average compared with the baseline method in 500 P/E cycles and 1000 P/E cycles, respectively.