Towards characterizing adversarial defects of deep learning software from the lens of uncertainty
Xiyue Zhang, Xiaofei Xie, Lei Ma, Xiaoning Du, Qiang Hu, Yang Liu, Jianjun Zhao, Meng Sun · 2020
Over the past decade, deep learning (DL) has been successfully applied to many industrial domain-specific tasks. However, the current state-of-the-art DL software still suffers from quality issues, which raises great concern especially in the context of safety- and security-critical scenarios. Adversarial examples (AEs) represent a typical and important type of defects needed to be urgently addressed, on which a DL software makes incorrect decisions. Such defects occur through either intentional attack or physical-world noise perceived by input sensors, potentially hindering further industry deployment. The intrinsic uncertainty nature of deep learning decisions can be a fundamental reason for its incorrect behavior. Although some testing, adversarial attack and defense techniques have been recently proposed, it still lacks a systematic study to uncover the relationship between AEs and DL uncertainty.