Trust Assessment for Electronic Components using Laser and Emission-based Microscopy
Andrew Stern, Jason Vosatka, Shahin Tajik, Farimah Farahmandi, Mark Mohammad Tehranipoor · 2020
The root-of-trust in mission-critical systems originates with hardware. Evaluating each component for trust prior to installation is essential for modern electronic systems. We propose laser and emission-based microscopy to non-destructively assess integrated circuits with high confidence. We demonstrate this approach on a 28 nm device.