Proficiency Testing Scheme of Conducted disturbance at mains terminals in 150kHz∼30MHz using Multi-items
Mi Jincai, Hui Chen, Qunxing Liu, Xin Liu, Chu Rui, Song Jun · 2020
The paper introduces a Proficiency Testing scheme of conducted disturbance at mains terminals in 150kHz~30MHz using Multi-items method, compared with a single item Proficiency Testing scheme, test time and costs is greatly reduced, reliability is largely increased. 150 items which could generate comb signal with stable frequency and stable voltage in the frequency range of 150 kHz to 30MHz were developed. And the item could simulate the power supply, grounding and setup of the actual test sample. Mailed it to 101 participants in parallel to evaluates performance and identifies problems of participants.