Metrological tools for the reference materials and reference instruments of the NIST material measurement laboratory
Carlos Beauchamp, Johanna Eltz Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David Lee Duewer, Michael S. Epstein, Margaret C. Kline, Katrice A. Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio M. Possolo, Katherine E. Sharpless, John R. Sieber · 2020
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