Development and Implementation of a Board Checker for Fast Loop Circuitry in Testing Microelectronic Packages
Jeffrey P. Abillar · International Journal of Advanced Trends in Computer Science and Engineering · 2020
This paper presents a method of development and implementation of a board checker for Fast Loop Circuit (FLC) for Microelectronic Packages test.Some microelectronic package has fast loop circuitry which has instrumentation amplifiers installed.These are connected to the device under test (DUT) such as operational amplifiers test boards.A fast loop topology (FLT), which is composed of three instrumentation amplifiers, are used to function as precision close-loop gain blocks for the board checker.These amplifiers are used for differential measurements to obtain offset voltage and input bias current measurements.A program was developed to measure these parameters and to compute the gain for evaluation.The checking of such amplifiers in fast loop circuits needs more integrity to avoid rejects and down time in the production of microelectronic packages.A device interface board (DIB) is introduced to interface the DUT and the board checker.A case study was attempted to be resolved about returned products due of failure in meeting the desired specifications due to over acceptance of the board checker with large offset voltage and out of range bias current.Several samples of Analog Devices products were tested using the board checker.The results show that the developed checker was able to detect good samples with higher accuracy and repeatability and were recommended for use in test processes in the production of microelectronic packages.