Transient Ground Potential Rise Impact on Reliability of Sensor and IED
Longlong Li, Wenbing Zhu, Zhixin Gao, Feng Yi, Wei Xu · 2020 5th Asia Conference on Power and Electrical Engineering (ACPEE) · 2020
In the smart substation, transient ground potential rise caused by lightning current is one of the main factors that affect the measurement accuracy and reliability of high voltage equipment sensor and IED (Intelligent Electronic Device). The paper established mathematical model for Impulse Generator and analyzes the variation trend of sensor and IED grounding shell potential under different parameters of impulse current. According to the equivalent circuit and simulation result, the paper designed a test apparatus which is used for the reliability test of sensor and IED, the test apparatus is composed of impulse generator, waveform adjusting unit and sample mounting platform. The results showed that under the standard current wave 8/20us, 10/350us, 10/1000us, the peak voltage of the platform to ground could up to 10kV, under the standard combination wave, the maximum peak voltage of the platform to ground could up to 12.1kV, and met the requirements of reliability test of transient ground potential rise for sensor and IED in substation.