A low-cost test strategy based on transient response method for embedded reconfigurable filters
Emanuel A. Dri, Gabriela Peretti, Eduardo Abel Romero · International Journal of Electronics · 2020
This work introduces a low-cost test strategy for second-order lowpass filters implemented in analog reconfigurable circuits of PSoC1 devices. By adopting a functional approach, the specifications of the filters are determined through the analysis of their transient response features. The strategy relies on the device dynamic reconfiguration ability to minimise test hardware overhead. Additionally, it is capable of testing filters configured in all the programmable resources of the device. Test stimuli are produced in a signal generator implemented inside the chip. A test script running on a computer connected to an oscilloscope (or data acquisition board), processes the response of the filters and calculates their functional features. Experimental results in several chips show excellent stability and low errors against nominal values, proving the viability of the strategy. The proposal is compatible with field maintenance due to its low instrumental overhead. Additionally, it can be used as a low-cost production test, for debugging circuits during the development process, or as end-of-line testing.