Springer handbook of materials measurement methods
Materials Today · 2006
Methods for examining structure at the microscopic scale have seen a number of recent developments.Many scanning probe microscopies have emerged, aberration correctors are revolutionizing traditional electron microscopy, and optical microscopy has seen the arrival of fluorescent, confocal, and two-photon variants.The contributions in this book each review a form of microscopy, describing the instruments and their areas of application.