Fault Tolerance in a Tree of Galois Linear Modules.
J. M. Marver · Defense Technical Information Center (DTIC) · 1976
The application of Galois logic design to fault tolerant technology has been investigated. A method of fault detection, location, and suppression has been found which has a minimal set of test inputs. A single comparison test detects most single and double internal and external Galois linear module stuck-at errors. The detection and location circuits are very simple compared to the complexity of the Galois linear module. A reconfiguration technique is described for the first time as it concerns trees of Galois linear modules. A single standard module with input multiplexers for spare selection can be replicated with very minimal additional logic. (Author)