Application Verification of Power IOT Low-power MCU in Laboratory Environment
Yanxin Zhang, Jinwang Li, Dejian Li, Lang Tan, Lixin Yang, Baodong Yu · 2019 3rd International Conference on Electronic Information Technology and Computer Engineering (EITCE) · 2019
Focusing on the requirements of ubiquitous power IOT construction and improving the overall technical level RI WKH ³State Grid Chip´ LQGXVWU\ RXU FRPSDQ\ KDV independently developed a low-power general-purpose MCU chip, which can be widely used in the battery-powered applications, such as indicator unit of fault indicators and smart meters. This paper introduces an MCU verification method based on the fault indication unit application in the laboratory environment, that is, how to set up the application scenario of the simulated fault indication unit in the laboratory environment to verify whether the various indicators of the chip meet the actual application requirements. The verification method includes software implementation, laboratory hardware verification environment construction, and verification method implementation.