Reduction of Combi-Fault Collapsing Using Maximum Fanout Branch Partitioning
P. Pattunnarajam, Reeba Korah, Mariakalavathy · Journal of Computational and Theoretical Nanoscience · 2020
Combi-Fault collapsing is a very important approach to reduce linked stuck at faults and to cause effective faults in a combinational circuit. It can significantly moderate the problem of test generation and test work. In this paper, MAXFAN (Maximum Fanout Branch) partitioning is converted into gate level circuit with site of reconvergence into Fanout-Free Regions and implication of faulty values in the cone is passed over to identify checkpoint faults, equivalence and dominance faults. This method is to compute the tests for SSF (single stuck at faults) and consequently achieves low fault collapse ratio. Experimental result shows that max fanout partitioning reduces the number of checkpoints and also reduces the maximum number of faults with low collapse ratio.