Modeling attacks against device authentication using CMOS image sensor PUF
Hiroshi Yamada, Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino · IEICE Electronics Express · 2021
A CMOS image sensor physical unclonable function (CIS PUF), which generates a unique response extracted from manufacturing process variations, is utilized for device authentication. In this paper, we report modeling attacks on a CIS PUF, in which column fixed pattern noise is exploited in a sorting attack. When the PUF response is generated with a pairwise comparison method, unknown responses are predicted with an accuracy of over 87.8% with only 0.31% of the training sample of the entire challenge and response pairs.