Automatic test system design based on generalization platform
Wei Yan, Peng Zhang, Qi Tao, Guo Shi-yong, Baolin Du, Gan Hui · Sixth Symposium on Novel Optoelectronic Detection Technology and Applications · 2020
Under the background of the test equipment adopting the generalized platform hardware environment, an automatic test system design implementation method is proposed, which will divide the test resource information into test elements such as device library, ICD library, use case library, etc., and refer to the test standard to describe the characteristics and test elements of the language ATML. Classify test case descriptions as standard incentive response commands and use common test software to complete the automated testing process. The automatic test system integrates key test elements such as test data, test strategy and requirements, test steps, test results management, and provides the overall system structure resources, test description, test results, configuration information, public information, etc., and solves a series of problems brought about by manual detection and maintenance.