Research on Chip Test Method for Improving Test Quality
He Yan, Xi Feng, Yi Tang Hu, Xiaoke Tang · 2019
As the integration level of chip increases, the mass testing after wafer fabrication has become more and more complex. How to improve the quality of chip testing has become an important issue. In this paper, several chip test methods that can be used for mass production are studied in combination with our actual test examples. These methods can improve the chip test coverage, reduce the early failure rate of the chip and improve the chip reliability, thus improving the quality of the chip test.